Silicon Bring-up · All levels
Silicon Bring-up Metrics Reference
Core metrics for reproducibility, closure quality, and release confidence in post-silicon programs.
Core metric families
Progression metrics: stage checkpoint pass rate and time-to-next-milestone.
Debug metrics: time-to-first-root-cause and disproof efficiency.
Correlation metrics: ATE-to-bench signature match quality and replay fidelity.
Margin metrics: pass-island continuity and guardband confidence under V/F/T sweeps.
Release metrics: recurrence trend after mitigation and unresolved-risk count.
diagram
EVIDENCE MATRIX - Silicon Bring-up closure
+-------------------------------+--------------------------------+--------------------------------+-----------------------------+
| Evidence | Tells you | Does not prove | Next action |
+-------------------------------+--------------------------------+--------------------------------+-----------------------------+
| rail/current timeline | sequencing and power health | firmware or protocol integrity | align with stage logs |
| stage checkpoint logs | failing transition boundary | electrical root cause | correlate with scope traces |
| interface trace/decode | protocol behavior and timing | global platform readiness | replay under fixed setup |
| shmoo/corner matrix | margin-sensitive fail region | exact failing mechanism | isolate with targeted tests |
| before/after replay packet | mitigation movement quality | long-run stability | run soak and corner matrix |
+-------------------------------+--------------------------------+--------------------------------+-----------------------------+