Static and Dynamic DAC Metrics: INL/DNL, Glitch, and SFDR: Step-by-Step Walkthrough

Step-by-step analysis walkthrough

Use this sequence when owning Static and Dynamic DAC Metrics: INL/DNL, Glitch, and SFDR during integration review.

1. Freeze setup and operating profile.

2. Map source-path-victim and expected transfer behavior.

3. Measure dominant contributors separately.

4. Verify model and bench condition equivalence.

5. Apply one controlled mitigation branch.

6. Re-run representative matrix and document residual risk.

Artifacts to collect

• Measurement plan connecting static sweep plots (INL/DNL) to dynamic FFT results (SFDR/THD/glitch-sensitive tones).

• setup and calibration log

• correlated simulation deck notes

• stress-matrix report

• owner signoff summary

Decision memo template

ANALOG DECISION MEMO - Static and Dynamic DAC Metrics: INL/DNL, Glitch, and SFDR
symptom:
mechanism:
artifact:
mitigation:
validation:
owners: analog validation owner, test engineering owner, signal integrity owner, calibration algorithm owner, product quality owner

Analog deep dive

DAC closure needs both static transfer quality and dynamic glitch/spectral discipline.

Concept diagram

DAC OUTPUT CHAIN

code mapping -> switching network -> output path -> reconstruction filter

Metric graph

DAC RISK MIX

major-carry glitches     █████
settling residuals       ████
image leakage            ███

Metrics and artifacts to collect

• INL/DNL sweep package

• glitch energy and settling trend

• SFDR/THD versus output frequency

• reconstruction filter compliance

Mini case study

Good static linearity masked dynamic spur failures driven by switching asymmetry and insufficient reconstruction margin.

Debug branches

• Tie static transfer plots to dynamic spectral outcomes.

• Inspect major-carry behavior separately from small-step transitions.

• Validate output path with realistic load and package parasitics.

Senior review question

Ask: which source-path-victim boundary failed first, and which artifact proves it reproducibly?

Key takeaways

• Tie every analog claim to one measurable metric and one proving artifact.

• Prefer minimal reversible mitigations with explicit owner and rollback criteria.

Common pitfalls

• Treating all noise as one scalar instead of path and frequency dependent behavior.

• Changing multiple analog knobs at once and losing causality.

• Declaring closure from nominal behavior without stress replay evidence.

Principal analog review addendum

Static and Dynamic DAC Metrics: INL/DNL, Glitch, and SFDR should be reviewed as an end-to-end execution problem spanning architecture, implementation, and integration.

Use DNL/INL limits, missing-code incidence, glitch impulse area at major carries, and SFDR/THD across output frequency sweep. as the trigger metric and Measurement plan connecting static sweep plots (INL/DNL) to dynamic FFT results (SFDR/THD/glitch-sensitive tones). as the proof contract.

DAC closure requires both static linearity discipline and dynamic switching-spectrum control. Durable closure comes from explicit assumptions and owner accountability.