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Course contents

  • How to Use This Course
  • DFT Metrics Reference
  • DFT Glossary
  • Reading Path
  • Scan Fundamentals61
  • Compression & Diagnosis61
  • ATPG & Pattern Generation61
  • MBIST & LBIST61
  • Boundary Scan & JTAG61
  • Test Timing & Power61
  • DFT Physical Integration61
  • DFT Interview Prep61
  • DFT / ATPG Cheatsheet
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‹Design for Test
  1. Topics
  2. Design for Test
  3. DFT Metrics Reference

DFT / ATPG · All levels

DFT Metrics Reference

Core metrics for DFT release and production stability.

Core metric families

  • Quality: fault coverage, defect-level proxies, escapes.

  • Cost: pattern count, tester memory, test time.

  • Robustness: shift/capture timing margin, test IR/thermal headroom.

  • Debug: diagnosis resolution, replay reproducibility.

  • Execution: closure iterations, unresolved waivers, owner latency.

Diagram
METRIC GRAPH - coverage / pattern count / test-power margin

quality metric
  ^
  |                         target
  |                       - - - - - - -
  |                  o after fix + regression
  |              o
  |         o baseline
  |    o regressed run
  +--------------------------------------> closure iteration
    input audit     focused fix      signoff review

Readout:
  - explain what moved, why it moved, and who approved it
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See also

  • Reading Path
  • Scan Fundamentals
  • Compression & Diagnosis