Skip to content
DenseChip
Learn
PracticeCode labInterview
LearnPracticeCode labInterview

DenseChip

Navigate

Menu

LearnPracticeCode labInterview

Tools

All toolsSV editorCode repoResume
DenseChip

Practice, courses, and chip-design tools in one focused workspace.

LearnPracticeCode labInterviewToolsLearning paths

© 2026 DenseChip

AboutContactPrivacyTerms
← Topics
  1. Topics
  2. Design for Test

Design for Test

All courses

Intermediate · ~18 h · 493 lessons · 8 sections

Make chips testable: scan chains, BIST and ATPG for stuck-at faults.

Start courseHow to Use This Course

Course map

  1. How to Use This Course
    1 lesson

    Starts with How to Use This Course

  2. DFT Metrics Reference
    1 lesson

    Starts with DFT Metrics Reference

  3. DFT Glossary
    1 lesson

    Starts with DFT Glossary

  4. Reading Path
    1 lesson

    Starts with Reading Path

  5. Scan Fundamentals
    61 lessons

    Starts with Scan Cell Architecture: Mechanism

  6. Compression & Diagnosis
    61 lessons

    Starts with Compression Architectures: Mechanism

  7. ATPG & Pattern Generation
    61 lessons

    Starts with Fault Models: Mechanism

  8. MBIST & LBIST
    61 lessons

    Starts with MBIST Integration: Mechanism

  9. Boundary Scan & JTAG
    61 lessons

    Starts with JTAG TAP Architecture: Mechanism

  10. Test Timing & Power
    61 lessons

    Starts with Test-Mode SDC: Mechanism

  11. DFT Physical Integration
    61 lessons

    Starts with Scan Chain Physical Effects: Mechanism

  12. DFT Interview Prep
    61 lessons

    Starts with DFT Whiteboard Framework: Mechanism

  13. DFT / ATPG Cheatsheet
    1 lesson

    Starts with DFT / ATPG Cheatsheet

About this course

Course promise

This is the production DFT course for silicon teams. It teaches how to architect scan and test flows, close quality metrics, and debug silicon mismatches with strong release discipline.

  • Scan, compression, ATPG, MBIST/LBIST, and JTAG foundations.

  • Test timing, power, and physical integration closure.

  • Diagnosis and yield learning loops.

  • Every topic follows metric -> mechanism -> evidence -> owner -> regression -> decision.

Course map

Show how the course is organised
Diagram
scan fundamentals
  -> compression and diagnosis
  -> ATPG and coverage closure
  -> MBIST/LBIST and JTAG
  -> test timing/power + physical integration
  -> interview and release readiness

Related topics

  • Physical Design - integration
  • Silicon bring-up course
  • RTL - DFT scan module

Section deep dive

DFT signoff needs traceable architecture, constraints, and silicon evidence.

Concept diagram

Show Concept diagram
Diagram
scan architecture -> pattern generation -> silicon evidence

Metric graph

Show Metric graph
Diagram
coverage and quality trend

Reports and artifacts

  • coverage

  • pattern count

  • test timing

  • diagnosis

Mini case study

Tag every run and artifact to avoid ghost regressions.

Debug branches

  • Check constraints first

Senior review question

Ask: what evidence proves this DFT decision is safe for production?

Open question bankPractice questions for this track