Worked Example for Scenario: Coverage Storm focuses on coverage shortfall under schedule pressure, pattern growth slope. The goal is to convert metric movement into mechanism, owner, and release decision.
A release review shows regression on coverage shortfall under schedule pressure, pattern growth slope. The strongest first move is to freeze evidence, isolate one failing bucket, and prove mechanism before changing flow knobs.
DFT FLOW - Scenario: Coverage Storm
scan insertion -> chain stitch -> compression map -> ATPG -> tester apply -> diagnosis
| | | | |
controllability shift balance channel use coverage silicon correlation
Primary metric: coverage shortfall under schedule pressure, pattern growth slopecoverage gap
-> untestable? constraint? model?
-> targeted fixes
-> pattern budget checkCapture failing report and exact run tags.
Tag scenario (mode, lot/corner, pattern class).
Trace first dependency that changed.
Compare against coverage gap snapshot, fault bucket analysis, closure plan.
Choose one reversible fix and predefine regression checks.
BEFORE / AFTER - Scenario: Coverage Storm
metric quality
^
| --- release target
| o regressed
| o baseline
| o after fix
+-------------------------------> closure iteration
Prove quality, timing, and test-power all moved safely.Senior DFT interviews test tradeoff judgment under imperfect data.
INTERVIEW ANSWER LOOP
state metric -> explain mechanism -> request evidence -> propose fix -> list regressionANSWER QUALITY
mechanism clarity + ownership clarity + regression disciplinewhiteboard rubric
scenario scorecard
trap checklist
follow-up depth index
Candidate improved from tool-only answers to mechanism-first narratives by using metric->artifact->decision template.
Always state assumptions
Name cross-team owners
Discuss risk and fallback plan
Ask: what evidence proves this DFT decision is safe for production?
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Coverage crises require separating true untestable faults from constraint/model issues and choosing the smallest high-impact closure plan.
Metric: coverage shortfall under schedule pressure, pattern growth slope
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