DFT / ATPG · All levels
Scenario: Coverage Storm: Review Checklist
Review Checklist for Scenario: Coverage Storm.
Review checklist
Review Checklist for Scenario: Coverage Storm focuses on coverage shortfall under schedule pressure, pattern growth slope. The goal is to convert metric movement into mechanism, owner, and release decision.
Run tags and scenario context are explicit.
Constraints and legality assumptions are documented.
Quality, timing, and test-power checks are included.
Diagnosis evidence supports residual-risk decision.
Owners signed: ATPG owner, DFT lead, product quality owner.
Signoff ownership
OWNERSHIP MAP - Scenario: Coverage Storm
artifact owner
---------------- -----------------
architecture/report ATPG owner
constraints/setup DFT lead
physical/test product quality owner
Name an owner for each failing metric cluster.DFT deep dive
Senior DFT interviews test tradeoff judgment under imperfect data.
Concept diagram
INTERVIEW ANSWER LOOP
state metric -> explain mechanism -> request evidence -> propose fix -> list regressionMetric graph
ANSWER QUALITY
mechanism clarity + ownership clarity + regression disciplineReports and artifacts
whiteboard rubric
scenario scorecard
trap checklist
follow-up depth index
Mini case study
Candidate improved from tool-only answers to mechanism-first narratives by using metric->artifact->decision template.
Debug branches
Always state assumptions
Name cross-team owners
Discuss risk and fallback plan
Senior review question
Ask: what evidence proves this DFT decision is safe for production?
Key takeaways
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Common pitfalls
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Principal DFT review addendum
Coverage crises require separating true untestable faults from constraint/model issues and choosing the smallest high-impact closure plan.
Metric: coverage shortfall under schedule pressure, pattern growth slope