DFT / ATPG · All levels
Scenario: Coverage Storm: Reports & Metrics
Reports & Metrics for Scenario: Coverage Storm.
Reports and metrics
Reports & Metrics for Scenario: Coverage Storm focuses on coverage shortfall under schedule pressure, pattern growth slope. The goal is to convert metric movement into mechanism, owner, and release decision.
A report should support a release decision for coverage shortfall under schedule pressure, pattern growth slope. One headline number is rarely enough without setup tags and bucket-level evidence.
Metric movement
METRIC GRAPH - coverage shortfall under schedule pressure, pattern growth slope
quality metric
^
| target
| - - - - - - -
| o after fix + regression
| o
| o baseline
| o regressed run
+--------------------------------------> closure iteration
input audit focused fix signoff review
Readout:
- explain what moved, why it moved, and who approved itDistribution view
PATTERN HISTOGRAM - Scenario: Coverage Storm
pattern count
| ***
| *******
| ***********
|************* <- high-volume tail (optimize here)
+--------------------> pattern buckets
smoke stuck-at transition diagnosis
Balance quality and tester limits together.Track coverage shortfall under schedule pressure, pattern growth slope by context and pattern class.
Review trend and bucket detail together.
Keep quality, timing, and power metrics in one dashboard.
Store each metric next to the artifact and run tag.
DFT deep dive
Senior DFT interviews test tradeoff judgment under imperfect data.
Concept diagram
INTERVIEW ANSWER LOOP
state metric -> explain mechanism -> request evidence -> propose fix -> list regressionMetric graph
ANSWER QUALITY
mechanism clarity + ownership clarity + regression disciplineReports and artifacts
whiteboard rubric
scenario scorecard
trap checklist
follow-up depth index
Mini case study
Candidate improved from tool-only answers to mechanism-first narratives by using metric->artifact->decision template.
Debug branches
Always state assumptions
Name cross-team owners
Discuss risk and fallback plan
Senior review question
Ask: what evidence proves this DFT decision is safe for production?
Key takeaways
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Common pitfalls
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.