Skip to content
DenseChip
Learn
PracticeCode labInterview

DenseChip

Navigate

Menu

LearnPracticeCode labInterview

Tools

All toolsSV editorCode repoResume
DenseChip

Practice, courses, and chip-design tools in one focused workspace.

LearnPracticeCode labInterviewToolsLearning paths

© 2026 DenseChip

AboutContactPrivacyTerms
Skip to lesson

Course contents

  • How to Use This Course
  • DFT Metrics Reference
  • DFT Glossary
  • Reading Path
  • Scan Fundamentals61
  • Compression & Diagnosis61
  • ATPG & Pattern Generation61
  • MBIST & LBIST61
  • Boundary Scan & JTAG61
  • Test Timing & Power61
  • DFT Physical Integration61
    • Scan Chain Physical Effects
    • Test Logic Floorplan
      • Test Logic Floorplan: Mechanism
      • Test Logic Floorplan: Inputs & Outputs
      • Test Logic Floorplan: Reports & Metrics
      • Test Logic Floorplan: Debug Playbook
      • Test Logic Floorplan: Worked Example
      • Test Logic Floorplan: Pitfalls & Red Flags
      • Test Logic Floorplan: Interview Drills
      • Test Logic Floorplan: Review Checklist
      • Test Logic Floorplan: Theory Deep Dive
      • Test Logic Floorplan: Design Space
      • Test Logic Floorplan: Expanded Case Study
      • Test Logic Floorplan: Step-by-Step Walkthrough
      • Test Logic Floorplan: Comparison Matrix
      • Test Logic Floorplan: Software / Programmer View
      • Test Logic Floorplan: Silicon PPA Impact
    • DFT-PD Handoff
    • Physical DFT Debug
    • DFT Physical Integration: Tricky Q&A
  • DFT Interview Prep61
  • DFT / ATPG Cheatsheet
Loading lesson

‹Test Logic Floorplan
  1. Topics
  2. Design for Test
  3. DFT Physical Integration
  4. Test Logic Floorplan
  5. Test Logic Floorplan: Debug Playbook

DFT / ATPG · All levels

Test Logic Floorplan: Debug Playbook

Debug Playbook for Test Logic Floorplan.

On this page

    Debug playbook

    Debug Playbook for Test Logic Floorplan focuses on compression logic placement quality, test route detours, floorplan DFT ECO count. The goal is to convert metric movement into mechanism, owner, and release decision.

    Debug aims to find the first incorrect assumption, not the loudest downstream symptom. Start with reproducibility and ownership.

    Root-cause tree

    Diagram
    ROOT-CAUSE TREE - Test Logic Floorplan
    
    compression logic placement quality, test route detours, floorplan DFT ECO count regresses
            |
      setup changed?
        /        \
      yes         no
      |            |
    constraint    silicon or
    or ATPG       physical/test path
     /    \          |
    SDC   model    chain/clock/power/diagnosis
    diff  diff     isolate first failing signature
    1. Freeze run tags for patterns, constraints, and tester setup.

    2. Isolate first failing metric bucket and scenario.

    3. Classify failure source: model, constraints, physical, or silicon.

    4. Prove mechanism with one reduced replay or targeted run.

    5. Apply smallest owner-controlled fix.

    6. Re-run timing, power, and quality regression matrix.

    Review memo template

    Diagram
    STAFF DFT REVIEW MEMO - DFT Physical Integration / Test Logic Floorplan
    
    1. Symptom
       - Watched metric: compression logic placement quality, test route detours, floorplan DFT ECO count
       - Failing scenario: <mode/lot/corner/program>
       - Pattern class: <scan/transition/compressed/BIST/JTAG>
       - Tags: <constraints, patterns, tester program, netlist>
    
    2. Mechanism hypothesis
       - Primary mechanism: Placement of decompressors, compactors, and BIST controllers impacts routing quality, clocking, and timing closure effort.
       - Competing hypothesis: <constraint issue, model issue, physical issue, silicon issue>
       - Missing evidence: <report, replay, diagnosis trace>
    
    3. Proposed action
       - Minimal reversible change: <constraint fix, architecture tweak, pattern update>
       - Expected metric movement: <delta>
       - Regression risk: timing, power, quality, schedule
    
    4. Signoff
       - Re-run artifact: test logic floorplan review, placement snapshots, routing detour report
       - Required owners: PD owner, DFT owner, CTS owner
       - Final decision: release, waive, rollback, or escalate

    DFT deep dive

    Physical integration quality decides whether DFT architecture survives implementation realities.

    Concept diagram

    Diagram
    PHYSICAL DFT FLOW
    
    chain planning -> floorplan placement -> route -> test timing/power validation

    Metric graph

    Diagram
    ROUTING BURDEN
    
    poor chain order -> longer routes -> more hold buffers

    Reports and artifacts

    • scan physical wirelength

    • congestion heatmap

    • test clock skew

    • handoff issue tracker

    Mini case study

    Late scan reorder reduced route detours and eliminated a major shift hold cluster before signoff.

    Debug branches

    • Correlate chain order with congestion

    • Place compression logic near chain clusters

    • Keep DFT-PD handoff versioned

    Senior review question

    Ask: what evidence proves this DFT decision is safe for production?

    Key takeaways

    • State metric, lot/corner context, and pattern tag with every claim.

    • Treat timing, power, and quality as one signoff problem.

    Common pitfalls

    • Chasing coverage without legality checks.

    • Ignoring test-power side effects of pattern changes.

    • Debugging silicon without reproducible tags.

    Principal DFT review addendum

    Placement of decompressors, compactors, and BIST controllers impacts routing quality, clocking, and timing closure effort.

    Metric: compression logic placement quality, test route detours, floorplan DFT ECO count

    This content block can't be displayed here.

    Block type: unknown

    This content block can't be displayed here.

    Block type: unknown

    This content block can't be displayed here.

    Block type: unknown

    Previous

    389 / 493

    Next: Test Logic Floorplan: Worked Example

    Up next

    Up nextTest Logic Floorplan: Worked Example

    Sign in to save progress

    Practice this lessonReport an error

    See also

    • Test Logic Floorplan: Mechanism
    • Test Logic Floorplan: Inputs & Outputs
    • Test Logic Floorplan: Pitfalls & Red Flags