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Course contents

  • How to Use This Course
  • DFT Metrics Reference
  • DFT Glossary
  • Reading Path
  • Scan Fundamentals61
  • Compression & Diagnosis61
  • ATPG & Pattern Generation61
  • MBIST & LBIST61
  • Boundary Scan & JTAG61
  • Test Timing & Power61
  • DFT Physical Integration61
    • Scan Chain Physical Effects
    • Test Logic Floorplan
      • Test Logic Floorplan: Mechanism
      • Test Logic Floorplan: Inputs & Outputs
      • Test Logic Floorplan: Reports & Metrics
      • Test Logic Floorplan: Debug Playbook
      • Test Logic Floorplan: Worked Example
      • Test Logic Floorplan: Pitfalls & Red Flags
      • Test Logic Floorplan: Interview Drills
      • Test Logic Floorplan: Review Checklist
      • Test Logic Floorplan: Theory Deep Dive
      • Test Logic Floorplan: Design Space
      • Test Logic Floorplan: Expanded Case Study
      • Test Logic Floorplan: Step-by-Step Walkthrough
      • Test Logic Floorplan: Comparison Matrix
      • Test Logic Floorplan: Software / Programmer View
      • Test Logic Floorplan: Silicon PPA Impact
    • DFT-PD Handoff
    • Physical DFT Debug
    • DFT Physical Integration: Tricky Q&A
  • DFT Interview Prep61
  • DFT / ATPG Cheatsheet
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‹Test Logic Floorplan
  1. Topics
  2. Design for Test
  3. DFT Physical Integration
  4. Test Logic Floorplan
  5. Test Logic Floorplan: Mechanism

DFT / ATPG · All levels

Test Logic Floorplan: Mechanism

Mechanism for Test Logic Floorplan.

On this page

    Mechanism to understand

    Mechanism for Test Logic Floorplan focuses on compression logic placement quality, test route detours, floorplan DFT ECO count. The goal is to convert metric movement into mechanism, owner, and release decision.

    Placement of decompressors, compactors, and BIST controllers impacts routing quality, clocking, and timing closure effort. Think of DFT as a quality pipeline where setup quality determines what silicon evidence means.

    • Identify where controllability/observability is introduced.

    • Identify legal constraints and mode assumptions.

    • Identify failure class: architecture, constraints, physical, or silicon.

    Layered view

    Diagram
    DFT CLOSURE FLOW - Test Logic Floorplan
    
    scan/test architecture
            |
            v
    ATPG constraints + fault models
            |
            v
    pattern generation + compression
            |
            v
    timing/power/physical validation
            |
            v
    silicon diagnosis and release signoff
    
    Debug rule: always state metric, run tags, and owning team with any claim.

    Compression logic placement

    Diagram
    decompressor/compactor placement too far from chains
      -> detours + skew + route pressure

    Layer responsibilities

    Diagram
    DFT OWNERSHIP LAYERS - Test Logic Floorplan
    
    layer              owns                         failure mode
    ----------------   --------------------------   -------------------------
    rtl/architecture   scanability hooks            uncontrollable logic
    atpg/constraints   legal pattern intent         aborts, low coverage
    physical/clocking  chain route + test clocks    shift hold/timing escapes
    tester/program     pattern apply integrity      false binning / bad fails
    quality signoff    release criteria             escapes or schedule slip

    DFT deep dive

    Physical integration quality decides whether DFT architecture survives implementation realities.

    Concept diagram

    Diagram
    PHYSICAL DFT FLOW
    
    chain planning -> floorplan placement -> route -> test timing/power validation

    Metric graph

    Diagram
    ROUTING BURDEN
    
    poor chain order -> longer routes -> more hold buffers

    Reports and artifacts

    • scan physical wirelength

    • congestion heatmap

    • test clock skew

    • handoff issue tracker

    Mini case study

    Late scan reorder reduced route detours and eliminated a major shift hold cluster before signoff.

    Debug branches

    • Correlate chain order with congestion

    • Place compression logic near chain clusters

    • Keep DFT-PD handoff versioned

    Senior review question

    Ask: what evidence proves this DFT decision is safe for production?

    Key takeaways

    • State metric, lot/corner context, and pattern tag with every claim.

    • Treat timing, power, and quality as one signoff problem.

    Common pitfalls

    • Chasing coverage without legality checks.

    • Ignoring test-power side effects of pattern changes.

    • Debugging silicon without reproducible tags.

    Mechanism deep dive

    Placement of decompressors, compactors, and BIST controllers impacts routing quality, clocking, and timing closure effort.

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    See also

    • Test Logic Floorplan: Reports & Metrics
    • Test Logic Floorplan: Debug Playbook
    • Test Logic Floorplan: Worked Example