Mechanism for Test Logic Floorplan focuses on compression logic placement quality, test route detours, floorplan DFT ECO count. The goal is to convert metric movement into mechanism, owner, and release decision.
Placement of decompressors, compactors, and BIST controllers impacts routing quality, clocking, and timing closure effort. Think of DFT as a quality pipeline where setup quality determines what silicon evidence means.
Identify where controllability/observability is introduced.
Identify legal constraints and mode assumptions.
Identify failure class: architecture, constraints, physical, or silicon.
DFT CLOSURE FLOW - Test Logic Floorplan
scan/test architecture
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ATPG constraints + fault models
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pattern generation + compression
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timing/power/physical validation
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silicon diagnosis and release signoff
Debug rule: always state metric, run tags, and owning team with any claim.decompressor/compactor placement too far from chains
-> detours + skew + route pressureDFT OWNERSHIP LAYERS - Test Logic Floorplan
layer owns failure mode
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rtl/architecture scanability hooks uncontrollable logic
atpg/constraints legal pattern intent aborts, low coverage
physical/clocking chain route + test clocks shift hold/timing escapes
tester/program pattern apply integrity false binning / bad fails
quality signoff release criteria escapes or schedule slipPhysical integration quality decides whether DFT architecture survives implementation realities.
PHYSICAL DFT FLOW
chain planning -> floorplan placement -> route -> test timing/power validationROUTING BURDEN
poor chain order -> longer routes -> more hold buffersscan physical wirelength
congestion heatmap
test clock skew
handoff issue tracker
Late scan reorder reduced route detours and eliminated a major shift hold cluster before signoff.
Correlate chain order with congestion
Place compression logic near chain clusters
Keep DFT-PD handoff versioned
Ask: what evidence proves this DFT decision is safe for production?
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Placement of decompressors, compactors, and BIST controllers impacts routing quality, clocking, and timing closure effort.
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