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Course contents

  • How to Use This Course
  • DFT Metrics Reference
  • DFT Glossary
  • Reading Path
  • Scan Fundamentals61
  • Compression & Diagnosis61
  • ATPG & Pattern Generation61
  • MBIST & LBIST61
  • Boundary Scan & JTAG61
  • Test Timing & Power61
  • DFT Physical Integration61
    • Scan Chain Physical Effects
    • Test Logic Floorplan
    • DFT-PD Handoff
    • Physical DFT Debug
    • DFT Physical Integration: Tricky Q&A
  • DFT Interview Prep61
  • DFT / ATPG Cheatsheet
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‹DFT Physical Integration
  1. Topics
  2. Design for Test
  3. DFT Physical Integration
  4. DFT Physical Integration: Tricky Q&A

DFT / ATPG · All levels

DFT Physical Integration: Tricky Q&A

Senior interview and review questions for DFT Physical Integration.

On this page

    Section Q&A bank

    Use these drills after completing all topics in DFT Physical Integration. Answer with metric, mechanism, evidence, owner, and regression plan.

    What is the most expensive late DFT physical mistake?

    Diagram
    [INT][DFT][DFT-PHYSICAL-INTEGRATION]
    
    Q: What is the most expensive late DFT physical mistake?
    
    A:
    Poor chain order/floorplan assumptions that require large-scale reroute and hold repair near signoff.
    
    FOLLOW-UP TRAP: Treating chain ordering as a post-route cleanup item.

    How do you reduce DFT-PD churn?

    Diagram
    [INT][DFT][DFT-PHYSICAL-INTEGRATION]
    
    Q: How do you reduce DFT-PD churn?
    
    A:
    Versioned handoff contracts for chain rules, test clocks, placement legality, and ownership.
    
    FOLLOW-UP TRAP: Relying on verbal agreements only.

    Q&A drill guide

    Diagram
    METRIC -> MECHANISM -> EVIDENCE -> FIX -> REGRESSION

    Sketch while answering

    Diagram
    PHYSICAL DFT FLOW
    
    chain planning -> floorplan placement -> route -> test timing/power validation

    Key takeaways

    • State metric, lot/corner context, and pattern tag with every claim.

    • Treat timing, power, and quality as one signoff problem.

    Common pitfalls

    • Chasing coverage without legality checks.

    • Ignoring test-power side effects of pattern changes.

    • Debugging silicon without reproducible tags.

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    See also

    • Scan Chain Physical Effects
    • Test Logic Floorplan
    • DFT-PD Handoff