Worked Example for Test Logic Floorplan focuses on compression logic placement quality, test route detours, floorplan DFT ECO count. The goal is to convert metric movement into mechanism, owner, and release decision.
A release review shows regression on compression logic placement quality, test route detours, floorplan DFT ECO count. The strongest first move is to freeze evidence, isolate one failing bucket, and prove mechanism before changing flow knobs.
DFT FLOW - Test Logic Floorplan
scan insertion -> chain stitch -> compression map -> ATPG -> tester apply -> diagnosis
| | | | |
controllability shift balance channel use coverage silicon correlation
Primary metric: compression logic placement quality, test route detours, floorplan DFT ECO countdecompressor/compactor placement too far from chains
-> detours + skew + route pressureCapture failing report and exact run tags.
Tag scenario (mode, lot/corner, pattern class).
Trace first dependency that changed.
Compare against test logic floorplan review, placement snapshots, routing detour report.
Choose one reversible fix and predefine regression checks.
BEFORE / AFTER - Test Logic Floorplan
metric quality
^
| --- release target
| o regressed
| o baseline
| o after fix
+-------------------------------> closure iteration
Prove quality, timing, and test-power all moved safely.Physical integration quality decides whether DFT architecture survives implementation realities.
PHYSICAL DFT FLOW
chain planning -> floorplan placement -> route -> test timing/power validationROUTING BURDEN
poor chain order -> longer routes -> more hold buffersscan physical wirelength
congestion heatmap
test clock skew
handoff issue tracker
Late scan reorder reduced route detours and eliminated a major shift hold cluster before signoff.
Correlate chain order with congestion
Place compression logic near chain clusters
Keep DFT-PD handoff versioned
Ask: what evidence proves this DFT decision is safe for production?
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Placement of decompressors, compactors, and BIST controllers impacts routing quality, clocking, and timing closure effort.
Metric: compression logic placement quality, test route detours, floorplan DFT ECO count
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