Reports & Metrics for Test Logic Floorplan focuses on compression logic placement quality, test route detours, floorplan DFT ECO count. The goal is to convert metric movement into mechanism, owner, and release decision.
A report should support a release decision for compression logic placement quality, test route detours, floorplan DFT ECO count. One headline number is rarely enough without setup tags and bucket-level evidence.
METRIC GRAPH - compression logic placement quality, test route detours, floorplan DFT ECO count
quality metric
^
| target
| - - - - - - -
| o after fix + regression
| o
| o baseline
| o regressed run
+--------------------------------------> closure iteration
input audit focused fix signoff review
Readout:
- explain what moved, why it moved, and who approved itPATTERN HISTOGRAM - Test Logic Floorplan
pattern count
| ***
| *******
| ***********
|************* <- high-volume tail (optimize here)
+--------------------> pattern buckets
smoke stuck-at transition diagnosis
Balance quality and tester limits together.Track compression logic placement quality, test route detours, floorplan DFT ECO count by context and pattern class.
Review trend and bucket detail together.
Keep quality, timing, and power metrics in one dashboard.
Store each metric next to the artifact and run tag.
Physical integration quality decides whether DFT architecture survives implementation realities.
PHYSICAL DFT FLOW
chain planning -> floorplan placement -> route -> test timing/power validationROUTING BURDEN
poor chain order -> longer routes -> more hold buffersscan physical wirelength
congestion heatmap
test clock skew
handoff issue tracker
Late scan reorder reduced route detours and eliminated a major shift hold cluster before signoff.
Correlate chain order with congestion
Place compression logic near chain clusters
Keep DFT-PD handoff versioned
Ask: what evidence proves this DFT decision is safe for production?
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
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