Use these drills after completing all topics in Compression & Diagnosis. Answer with metric, mechanism, evidence, owner, and regression plan.
[INT][DFT][COMPRESSION-DIAGNOSTICS]
Q: How can higher compression reduce debug quality?
A:
Aggressive compaction and X pressure can reduce diagnosis resolution and increase aliasing ambiguity.
FOLLOW-UP TRAP: Optimizing ratio without diagnosis evidence.[INT][DFT][COMPRESSION-DIAGNOSTICS]
Q: Pattern count jumps 2x overnight. What do you inspect first?
A:
Constraint diffs, X-source changes, and compression channel configuration tags.
FOLLOW-UP TRAP: Assuming silicon quality changed overnight.METRIC -> MECHANISM -> EVIDENCE -> FIX -> REGRESSIONCOMPRESSION LOOP
EDT/decompressor -> compressed patterns -> compactor responses -> diagnosisState metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.