DFT / ATPG · All levels
Debug Access Port: Reports & Metrics
Reports & Metrics for Debug Access Port.
Reports and metrics
Reports & Metrics for Debug Access Port focuses on debug access latency, security lock compliance, bring-up access reliability. The goal is to convert metric movement into mechanism, owner, and release decision.
A report should support a release decision for debug access latency, security lock compliance, bring-up access reliability. One headline number is rarely enough without setup tags and bucket-level evidence.
Metric movement
METRIC GRAPH - debug access latency, security lock compliance, bring-up access reliability
quality metric
^
| target
| - - - - - - -
| o after fix + regression
| o
| o baseline
| o regressed run
+--------------------------------------> closure iteration
input audit focused fix signoff review
Readout:
- explain what moved, why it moved, and who approved itDistribution view
PATTERN HISTOGRAM - Debug Access Port
pattern count
| ***
| *******
| ***********
|************* <- high-volume tail (optimize here)
+--------------------> pattern buckets
smoke stuck-at transition diagnosis
Balance quality and tester limits together.Track debug access latency, security lock compliance, bring-up access reliability by context and pattern class.
Review trend and bucket detail together.
Keep quality, timing, and power metrics in one dashboard.
Store each metric next to the artifact and run tag.
DFT deep dive
Boundary scan and JTAG are board-level contracts, not just RTL features.
Concept diagram
JTAG ACCESS
TAP controller -> instruction register -> boundary/data register -> board test/debugMetric graph
BOARD TEST READINESS
instruction coverage vs pin controllabilityReports and artifacts
TAP compliance report
boundary cell coverage matrix
EXTEST/INTEST results
debug lock policy log
Mini case study
Board bring-up blocked by pinmux override in one mode; TAP instruction decode and package table alignment fixed path.
Debug branches
Verify TAP state transitions
Audit package pin ownership
Check security lifecycle lock behavior
Senior review question
Ask: what evidence proves this DFT decision is safe for production?
Key takeaways
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Common pitfalls
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.