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Course contents

  • How to Use This Course
  • DFT Metrics Reference
  • DFT Glossary
  • Reading Path
  • Scan Fundamentals61
  • Compression & Diagnosis61
  • ATPG & Pattern Generation61
    • Fault Models
    • ATPG Constraints
    • Pattern Signoff
    • Coverage Closure
      • Coverage Closure: Mechanism
      • Coverage Closure: Inputs & Outputs
      • Coverage Closure: Reports & Metrics
      • Coverage Closure: Debug Playbook
      • Coverage Closure: Worked Example
      • Coverage Closure: Pitfalls & Red Flags
      • Coverage Closure: Interview Drills
      • Coverage Closure: Review Checklist
      • Coverage Closure: Theory Deep Dive
      • Coverage Closure: Design Space
      • Coverage Closure: Expanded Case Study
      • Coverage Closure: Step-by-Step Walkthrough
      • Coverage Closure: Comparison Matrix
      • Coverage Closure: Software / Programmer View
      • Coverage Closure: Silicon PPA Impact
    • ATPG & Pattern Generation: Tricky Q&A
  • MBIST & LBIST61
  • Boundary Scan & JTAG61
  • Test Timing & Power61
  • DFT Physical Integration61
  • DFT Interview Prep61
  • DFT / ATPG Cheatsheet
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‹Coverage Closure
  1. Topics
  2. Design for Test
  3. ATPG & Pattern Generation
  4. Coverage Closure
  5. Coverage Closure: Expanded Case Study

DFT / ATPG · All levels

Coverage Closure: Expanded Case Study

Expanded Case Study for Coverage Closure.

On this page

    Extended case study

    Release review: coverage gap to target, dominant undetected classes, closure iteration count regresses after a test-flow update touching Coverage Closure.

    Background

    Team had prior signoff, then a new program/config introduced regressions in selected buckets.

    Symptoms observed

    • coverage gap to target, dominant undetected classes, closure iteration count regression

    • Mismatch between simulation and tester

    • Escalation without clear owner

    Investigation timeline

    1. Hour 0: freeze pattern set, constraints, and tester program tags

    2. Hour 1: isolate first failing bucket by mode/lot

    3. Hour 2: verify legality and constraints assumptions

    4. Hour 3: correlate with physical/timing/power context

    5. Hour 4: choose minimal reversible fix

    6. Hour 5: run full signoff regression matrix

    7. Hour 6: publish decision memo and owners

    Root cause

    Coverage gap driven by stale constraints and high-X blocks; targeted cleanup plus model tuning closed gap without large pattern growth.

    Fix and validation

    • Apply bounded fix with owner

    • Re-run coverage gap report, undetected fault buckets, closure action tracker

    • Re-validate quality, timing, and test power

    Lessons learned

    • Tag every run artifact

    • Mechanism first, command second

    • Close with explicit release decision

    Diagram
    CASE STUDY - Coverage Closure
    baseline metric / regressed metric / post-fix metric

    Sequence under stress

    Diagram
    DFT FLOW - Coverage Closure
    
    scan insertion -> chain stitch -> compression map -> ATPG -> tester apply -> diagnosis
          |                |                |            |             |
     controllability   shift balance    channel use   coverage     silicon correlation
    
    Primary metric: coverage gap to target, dominant undetected classes, closure iteration count

    DFT deep dive

    ATPG quality comes from fault model choice plus legal constraints, not raw pattern volume alone.

    Concept diagram

    Diagram
    ATPG FLOW
    
    fault model -> constraints -> generation -> simulation -> coverage closure -> signoff

    Metric graph

    Diagram
    COVERAGE GAP
    
    target coverage
      ^
      |      o before closure
      |          o after fixes
      +---------------------> iteration

    Reports and artifacts

    • fault model coverage

    • untestable class report

    • constraint legality errors

    • pattern signoff memo

    Mini case study

    Transition coverage stalled due to clock constraints mismatch; updated at-speed capture definitions recovered target.

    Debug branches

    • Classify untestable faults

    • Diff ATPG constraints each run

    • Pair coverage with pattern budget

    Senior review question

    Ask: what evidence proves this DFT decision is safe for production?

    Key takeaways

    • State metric, lot/corner context, and pattern tag with every claim.

    • Treat timing, power, and quality as one signoff problem.

    Common pitfalls

    • Chasing coverage without legality checks.

    • Ignoring test-power side effects of pattern changes.

    • Debugging silicon without reproducible tags.

    Principal DFT review addendum

    Coverage closure uses targeted analysis of undetected faults, constraints, and design-for-test hooks to close quality gaps without exploding pattern volume.

    Metric: coverage gap to target, dominant undetected classes, closure iteration count

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    Next: Coverage Closure: Step-by-Step Walkthrough

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    See also

    • Coverage Closure: Mechanism
    • Coverage Closure: Inputs & Outputs
    • Coverage Closure: Reports & Metrics