Debug Playbook for Coverage Closure focuses on coverage gap to target, dominant undetected classes, closure iteration count. The goal is to convert metric movement into mechanism, owner, and release decision.
Debug aims to find the first incorrect assumption, not the loudest downstream symptom. Start with reproducibility and ownership.
ROOT-CAUSE TREE - Coverage Closure
coverage gap to target, dominant undetected classes, closure iteration count regresses
|
setup changed?
/ \
yes no
| |
constraint silicon or
or ATPG physical/test path
/ \ |
SDC model chain/clock/power/diagnosis
diff diff isolate first failing signatureFreeze run tags for patterns, constraints, and tester setup.
Isolate first failing metric bucket and scenario.
Classify failure source: model, constraints, physical, or silicon.
Prove mechanism with one reduced replay or targeted run.
Apply smallest owner-controlled fix.
Re-run timing, power, and quality regression matrix.
STAFF DFT REVIEW MEMO - ATPG & Pattern Generation / Coverage Closure
1. Symptom
- Watched metric: coverage gap to target, dominant undetected classes, closure iteration count
- Failing scenario: <mode/lot/corner/program>
- Pattern class: <scan/transition/compressed/BIST/JTAG>
- Tags: <constraints, patterns, tester program, netlist>
2. Mechanism hypothesis
- Primary mechanism: Coverage closure uses targeted analysis of undetected faults, constraints, and design-for-test hooks to close quality gaps without exploding pattern volume.
- Competing hypothesis: <constraint issue, model issue, physical issue, silicon issue>
- Missing evidence: <report, replay, diagnosis trace>
3. Proposed action
- Minimal reversible change: <constraint fix, architecture tweak, pattern update>
- Expected metric movement: <delta>
- Regression risk: timing, power, quality, schedule
4. Signoff
- Re-run artifact: coverage gap report, undetected fault buckets, closure action tracker
- Required owners: ATPG owner, DFT owner, design owner
- Final decision: release, waive, rollback, or escalateATPG quality comes from fault model choice plus legal constraints, not raw pattern volume alone.
ATPG FLOW
fault model -> constraints -> generation -> simulation -> coverage closure -> signoffCOVERAGE GAP
target coverage
^
| o before closure
| o after fixes
+---------------------> iterationfault model coverage
untestable class report
constraint legality errors
pattern signoff memo
Transition coverage stalled due to clock constraints mismatch; updated at-speed capture definitions recovered target.
Classify untestable faults
Diff ATPG constraints each run
Pair coverage with pattern budget
Ask: what evidence proves this DFT decision is safe for production?
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Coverage closure uses targeted analysis of undetected faults, constraints, and design-for-test hooks to close quality gaps without exploding pattern volume.
Metric: coverage gap to target, dominant undetected classes, closure iteration count
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