DFT / ATPG · All levels
Test Signoff Reports: Interview Drills
Interview Drills for Test Signoff Reports.
Interview drills
Interview Drills for Test Signoff Reports focuses on test readiness score, unresolved waivers, production release risk. The goal is to convert metric movement into mechanism, owner, and release decision.
PROMPT
You observe test readiness score, unresolved waivers, production release risk on Test Signoff Reports. Walk through diagnosis and release decision.
STRONG ANSWER
1. States context and run tags.
2. Explains mechanism: Test signoff consolidates coverage, timing, power, and diagnosis evidence into a release decision with explicit ownership and waivers.
3. Requests test signoff dashboard, waiver tracker, release review memo.
4. Proposes minimal fix and regression.
WEAK ANSWER
Jumps to tool switches without evidence quality, ownership, or regression plan.Diagram to draw on the whiteboard
Test timing/power flow
test SDC -> shift/capture timing -> power/IR checks -> releaseRoot-cause narrative
ROOT-CAUSE TREE - Test Signoff Reports
test readiness score, unresolved waivers, production release risk regresses
|
setup changed?
/ \
yes no
| |
constraint silicon or
or ATPG physical/test path
/ \ |
SDC model chain/clock/power/diagnosis
diff diff isolate first failing signatureDFT deep dive
Test signoff fails when shift/capture timing and test power are treated independently.
Concept diagram
TEST SIGNOFF LOOP
test SDC -> shift/capture timing -> power-aware ATPG -> IR validation -> releaseMetric graph
TEST CURRENT
functional current baseline
scan shift current peak-risk zoneReports and artifacts
test-mode STA report
shift/capture split
test power IR map
waiver tracker
Mini case study
At-speed patterns passed timing but failed in production due to peak shift IR; staggered capture and power-aware fill resolved.
Debug branches
Tag test and functional corners separately
Check hold in shift mode
Correlate fail bins with power hotspots
Senior review question
Ask: what evidence proves this DFT decision is safe for production?
Key takeaways
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Common pitfalls
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Principal DFT review addendum
Test signoff consolidates coverage, timing, power, and diagnosis evidence into a release decision with explicit ownership and waivers.
Metric: test readiness score, unresolved waivers, production release risk