Test Signoff Reports is central to Test Timing & Power. Test signoff consolidates coverage, timing, power, and diagnosis evidence into a release decision with explicit ownership and waivers. Senior DFT engineers tie metric movement to architecture assumptions, constraints, and silicon evidence rather than isolated tool output.
Test signoff consolidates coverage, timing, power, and diagnosis evidence into a release decision with explicit ownership and waivers.
Primary metric: test readiness score, unresolved waivers, production release risk
Primary artifact: test signoff dashboard, waiver tracker, release review memo
Owners: DFT lead, product engineering lead, program lead
Controllability and observability must be explicit
Production-quality requires reproducible pattern and tester tags
At release, Test Signoff Reports issues can create coverage escapes, unstable production bins, or long debug loops. Test timing and power closure are coupled and must be signed together.
test SDC -> shift/capture timing -> power/IR checks -> releaseName failing metric and scenario context (mode, lot/corner, program).
Open test readiness score, unresolved waivers, production release risk trend and isolate dominant failing bucket.
Trace architecture assumptions and legality constraints.
Check compression, clocking, and unknown handling dependencies.
Collect test signoff dashboard, waiver tracker, release review memo and confirm run tags.
Classify issue: model/constraint, physical/test setup, or real defect signal.
Propose minimal fix and list timing/power/quality regression checks.
Coverage percent alone proves release readiness.
More compression always means better outcome.
Silicon mismatch can be debugged without pattern/tester traceability.
Shift timing and test power can be signed independently.
test SDC -> shift/capture timing -> power/IR checks -> releaseDFT OWNERSHIP LAYERS - Test Signoff Reports
layer owns failure mode
---------------- -------------------------- -------------------------
rtl/architecture scanability hooks uncontrollable logic
atpg/constraints legal pattern intent aborts, low coverage
physical/clocking chain route + test clocks shift hold/timing escapes
tester/program pattern apply integrity false binning / bad fails
quality signoff release criteria escapes or schedule slipTest signoff fails when shift/capture timing and test power are treated independently.
TEST SIGNOFF LOOP
test SDC -> shift/capture timing -> power-aware ATPG -> IR validation -> releaseTEST CURRENT
functional current baseline
scan shift current peak-risk zonetest-mode STA report
shift/capture split
test power IR map
waiver tracker
At-speed patterns passed timing but failed in production due to peak shift IR; staggered capture and power-aware fill resolved.
Tag test and functional corners separately
Check hold in shift mode
Correlate fail bins with power hotspots
Ask: what evidence proves this DFT decision is safe for production?
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Test timing and power closure are coupled and must be signed together.
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