Test Signoff Reports: Worked Example

Worked example

Worked Example for Test Signoff Reports focuses on test readiness score, unresolved waivers, production release risk. The goal is to convert metric movement into mechanism, owner, and release decision.

A release review shows regression on test readiness score, unresolved waivers, production release risk. The strongest first move is to freeze evidence, isolate one failing bucket, and prove mechanism before changing flow knobs.

Sequence under inspection

DFT FLOW - Test Signoff Reports

scan insertion -> chain stitch -> compression map -> ATPG -> tester apply -> diagnosis
      |                |                |            |             |
 controllability   shift balance    channel use   coverage     silicon correlation

Primary metric: test readiness score, unresolved waivers, production release risk

Test timing/power flow

test SDC -> shift/capture timing -> power/IR checks -> release

1. Capture failing report and exact run tags.

2. Tag scenario (mode, lot/corner, pattern class).

3. Trace first dependency that changed.

4. Compare against test signoff dashboard, waiver tracker, release review memo.

5. Choose one reversible fix and predefine regression checks.

Did the fix work?

BEFORE / AFTER - Test Signoff Reports

metric quality
  ^
  |                    --- release target
  |      o regressed
  |           o baseline
  |                o after fix
  +-------------------------------> closure iteration

Prove quality, timing, and test-power all moved safely.

DFT deep dive

Test signoff fails when shift/capture timing and test power are treated independently.

Concept diagram

TEST SIGNOFF LOOP

test SDC -> shift/capture timing -> power-aware ATPG -> IR validation -> release

Metric graph

TEST CURRENT

functional current  baseline
scan shift current  peak-risk zone

Reports and artifacts

• test-mode STA report

• shift/capture split

• test power IR map

• waiver tracker

Mini case study

At-speed patterns passed timing but failed in production due to peak shift IR; staggered capture and power-aware fill resolved.

Debug branches

• Tag test and functional corners separately

• Check hold in shift mode

• Correlate fail bins with power hotspots

Senior review question

Ask: what evidence proves this DFT decision is safe for production?

Key takeaways

• State metric, lot/corner context, and pattern tag with every claim.

• Treat timing, power, and quality as one signoff problem.

Common pitfalls

• Chasing coverage without legality checks.

• Ignoring test-power side effects of pattern changes.

• Debugging silicon without reproducible tags.

Principal DFT review addendum

Test signoff consolidates coverage, timing, power, and diagnosis evidence into a release decision with explicit ownership and waivers.

Metric: test readiness score, unresolved waivers, production release risk