Debug playbook

Debug Playbook for Scan Cell Architecture focuses on scan cell legality rate, scan replacement ratio, scan DRC count. The goal is to convert metric movement into mechanism, owner, and release decision.

Debug aims to find the first incorrect assumption, not the loudest downstream symptom. Start with reproducibility and ownership.

Root-cause tree

ROOT-CAUSE TREE - Scan Cell Architecture

scan cell legality rate, scan replacement ratio, scan DRC count regresses
        |
  setup changed?
    /        \
  yes         no
  |            |
constraint    silicon or
or ATPG       physical/test path
 /    \          |
SDC   model    chain/clock/power/diagnosis
diff  diff     isolate first failing signature

1. Freeze run tags for patterns, constraints, and tester setup.

2. Isolate first failing metric bucket and scenario.

3. Classify failure source: model, constraints, physical, or silicon.

4. Prove mechanism with one reduced replay or targeted run.

5. Apply smallest owner-controlled fix.

6. Re-run timing, power, and quality regression matrix.

Review memo template

STAFF DFT REVIEW MEMO - Scan Fundamentals / Scan Cell Architecture

1. Symptom
   - Watched metric: scan cell legality rate, scan replacement ratio, scan DRC count
   - Failing scenario: <mode/lot/corner/program>
   - Pattern class: <scan/transition/compressed/BIST/JTAG>
   - Tags: <constraints, patterns, tester program, netlist>

2. Mechanism hypothesis
   - Primary mechanism: Scan insertion replaces functional flops with scan-capable cells so internal state becomes controllable and observable in test mode.
   - Competing hypothesis: <constraint issue, model issue, physical issue, silicon issue>
   - Missing evidence: <report, replay, diagnosis trace>

3. Proposed action
   - Minimal reversible change: <constraint fix, architecture tweak, pattern update>
   - Expected metric movement: <delta>
   - Regression risk: timing, power, quality, schedule

4. Signoff
   - Re-run artifact: scan insertion report, scan DRC log, scan replacement summary
   - Required owners: DFT owner, RTL owner, synthesis owner
   - Final decision: release, waive, rollback, or escalate

DFT deep dive

Scan architecture quality determines whether ATPG can control and observe real silicon state.

Concept diagram

SCAN INSERTION FLOW

scan-ready RTL -> scan replacement -> stitch chains -> DRC -> ATPG handoff

Metric graph

CHAIN BALANCE

chain length spread
low spread   = better shift time
high spread  = routing + hold risk

Reports and artifacts

• scan insertion summary

• chain balance report

• scan DRC log

• clocking legality report

Mini case study

Coverage plateau traced to non-scan flops in reset islands; RTL + DFT lint policy fixed root cause.

Debug branches

• Check scan replacement first

• Audit chain legality by domain

• Validate shift/capture clocks

Senior review question

Ask: what evidence proves this DFT decision is safe for production?

Key takeaways

• State metric, lot/corner context, and pattern tag with every claim.

• Treat timing, power, and quality as one signoff problem.

Common pitfalls

• Chasing coverage without legality checks.

• Ignoring test-power side effects of pattern changes.

• Debugging silicon without reproducible tags.

Principal DFT review addendum

Scan insertion replaces functional flops with scan-capable cells so internal state becomes controllable and observable in test mode.

Metric: scan cell legality rate, scan replacement ratio, scan DRC count