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Course contents

  • How to Use This Course
  • DFT Metrics Reference
  • DFT Glossary
  • Reading Path
  • Scan Fundamentals61
  • Compression & Diagnosis61
  • ATPG & Pattern Generation61
  • MBIST & LBIST61
    • MBIST Integration
    • Memory Repair Flow
    • LBIST Overview
      • LBIST Overview: Mechanism
      • LBIST Overview: Inputs & Outputs
      • LBIST Overview: Reports & Metrics
      • LBIST Overview: Debug Playbook
      • LBIST Overview: Worked Example
      • LBIST Overview: Pitfalls & Red Flags
      • LBIST Overview: Interview Drills
      • LBIST Overview: Review Checklist
      • LBIST Overview: Theory Deep Dive
      • LBIST Overview: Design Space
      • LBIST Overview: Expanded Case Study
      • LBIST Overview: Step-by-Step Walkthrough
      • LBIST Overview: Comparison Matrix
      • LBIST Overview: Software / Programmer View
      • LBIST Overview: Silicon PPA Impact
    • BIST Signoff
    • MBIST & LBIST: Tricky Q&A
  • Boundary Scan & JTAG61
  • Test Timing & Power61
  • DFT Physical Integration61
  • DFT Interview Prep61
  • DFT / ATPG Cheatsheet
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‹LBIST Overview
  1. Topics
  2. Design for Test
  3. MBIST & LBIST
  4. LBIST Overview
  5. LBIST Overview: Reports & Metrics

DFT / ATPG · All levels

LBIST Overview: Reports & Metrics

Reports & Metrics for LBIST Overview.

On this page

    Reports and metrics

    Reports & Metrics for LBIST Overview focuses on LBIST signature quality, random-pattern-resistant fault count, runtime budget. The goal is to convert metric movement into mechanism, owner, and release decision.

    A report should support a release decision for LBIST signature quality, random-pattern-resistant fault count, runtime budget. One headline number is rarely enough without setup tags and bucket-level evidence.

    Metric movement

    Diagram
    METRIC GRAPH - LBIST signature quality, random-pattern-resistant fault count, runtime budget
    
    quality metric
      ^
      |                         target
      |                       - - - - - - -
      |                  o after fix + regression
      |              o
      |         o baseline
      |    o regressed run
      +--------------------------------------> closure iteration
        input audit     focused fix      signoff review
    
    Readout:
      - explain what moved, why it moved, and who approved it

    Distribution view

    Diagram
    PATTERN HISTOGRAM - LBIST Overview
    
    pattern count
      |      ***
      |    *******
      |  ***********
      |*************  <- high-volume tail (optimize here)
      +--------------------> pattern buckets
       smoke  stuck-at  transition  diagnosis
    
    Balance quality and tester limits together.
    • Track LBIST signature quality, random-pattern-resistant fault count, runtime budget by context and pattern class.

    • Review trend and bucket detail together.

    • Keep quality, timing, and power metrics in one dashboard.

    • Store each metric next to the artifact and run tag.

    DFT deep dive

    BIST value is realized only when insertion, diagnosis, and repair are tied to production flow.

    Concept diagram

    Diagram
    BIST FLOW
    
    insert MBIST/LBIST -> execute -> collect signatures -> diagnose/repair -> signoff

    Metric graph

    Diagram
    REPAIR EFFECT
    
    yield
      ^
      |      o pre-repair
      |             o post-repair
      +---------------------> lot

    Reports and artifacts

    • MBIST insertion coverage

    • repair signature report

    • LBIST resistant fault list

    • BIST release checklist

    Mini case study

    Fuse programming mismatch blocked repair activation; corrected bring-up script recovered expected yield uplift.

    Debug branches

    • Validate BIST reachability

    • Correlate fail maps to repair signatures

    • Audit in-field boot test budget

    Senior review question

    Ask: what evidence proves this DFT decision is safe for production?

    Key takeaways

    • State metric, lot/corner context, and pattern tag with every claim.

    • Treat timing, power, and quality as one signoff problem.

    Common pitfalls

    • Chasing coverage without legality checks.

    • Ignoring test-power side effects of pattern changes.

    • Debugging silicon without reproducible tags.

    Reading reports

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    See also

    • LBIST Overview: Mechanism
    • LBIST Overview: Worked Example
    • LBIST Overview: Pitfalls & Red Flags