Reports and metrics

Reports & Metrics for Package Test Interface focuses on pin mux correctness, package test mode coverage, board bring-up escape count. The goal is to convert metric movement into mechanism, owner, and release decision.

A report should support a release decision for pin mux correctness, package test mode coverage, board bring-up escape count. One headline number is rarely enough without setup tags and bucket-level evidence.

Metric movement

METRIC GRAPH - pin mux correctness, package test mode coverage, board bring-up escape count

quality metric
  ^
  |                         target
  |                       - - - - - - -
  |                  o after fix + regression
  |              o
  |         o baseline
  |    o regressed run
  +--------------------------------------> closure iteration
    input audit     focused fix      signoff review

Readout:
  - explain what moved, why it moved, and who approved it

Distribution view

PATTERN HISTOGRAM - Package Test Interface

pattern count
  |      ***
  |    *******
  |  ***********
  |*************  <- high-volume tail (optimize here)
  +--------------------> pattern buckets
   smoke  stuck-at  transition  diagnosis

Balance quality and tester limits together.

• Track pin mux correctness, package test mode coverage, board bring-up escape count by context and pattern class.

• Review trend and bucket detail together.

• Keep quality, timing, and power metrics in one dashboard.

• Store each metric next to the artifact and run tag.

DFT deep dive

Boundary scan and JTAG are board-level contracts, not just RTL features.

Concept diagram

JTAG ACCESS

TAP controller -> instruction register -> boundary/data register -> board test/debug

Metric graph

BOARD TEST READINESS

instruction coverage vs pin controllability

Reports and artifacts

• TAP compliance report

• boundary cell coverage matrix

• EXTEST/INTEST results

• debug lock policy log

Mini case study

Board bring-up blocked by pinmux override in one mode; TAP instruction decode and package table alignment fixed path.

Debug branches

• Verify TAP state transitions

• Audit package pin ownership

• Check security lifecycle lock behavior

Senior review question

Ask: what evidence proves this DFT decision is safe for production?

Key takeaways

• State metric, lot/corner context, and pattern tag with every claim.

• Treat timing, power, and quality as one signoff problem.

Common pitfalls

• Chasing coverage without legality checks.

• Ignoring test-power side effects of pattern changes.

• Debugging silicon without reproducible tags.

Reading reports