DFT / ATPG · All levels
Chain Stitching Rules: Mechanism
Mechanism for Chain Stitching Rules.
Mechanism to understand
Mechanism for Chain Stitching Rules focuses on chain balance spread, max chain length, scan shift time. The goal is to convert metric movement into mechanism, owner, and release decision.
Scan flops are stitched into chains based on clock, power, and physical constraints; poor stitching increases test time and routing pain. Think of DFT as a quality pipeline where setup quality determines what silicon evidence means.
Identify where controllability/observability is introduced.
Identify legal constraints and mode assumptions.
Identify failure class: architecture, constraints, physical, or silicon.
Layered view
DFT CLOSURE FLOW - Chain Stitching Rules
scan/test architecture
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v
ATPG constraints + fault models
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v
pattern generation + compression
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v
timing/power/physical validation
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v
silicon diagnosis and release signoff
Debug rule: always state metric, run tags, and owning team with any claim.Chain stitching constraints
SCAN CHAINS
clock_domain_A: FF1 -> FF2 -> FF3 -> SO
clock_domain_B: FF4 -> FF5 -> FF6 -> SO
Rules:
1) keep domains legal
2) balance chain length
3) avoid long physical detoursLayer responsibilities
DFT OWNERSHIP LAYERS - Chain Stitching Rules
layer owns failure mode
---------------- -------------------------- -------------------------
rtl/architecture scanability hooks uncontrollable logic
atpg/constraints legal pattern intent aborts, low coverage
physical/clocking chain route + test clocks shift hold/timing escapes
tester/program pattern apply integrity false binning / bad fails
quality signoff release criteria escapes or schedule slipDFT deep dive
Scan architecture quality determines whether ATPG can control and observe real silicon state.
Concept diagram
SCAN INSERTION FLOW
scan-ready RTL -> scan replacement -> stitch chains -> DRC -> ATPG handoffMetric graph
CHAIN BALANCE
chain length spread
low spread = better shift time
high spread = routing + hold riskReports and artifacts
scan insertion summary
chain balance report
scan DRC log
clocking legality report
Mini case study
Coverage plateau traced to non-scan flops in reset islands; RTL + DFT lint policy fixed root cause.
Debug branches
Check scan replacement first
Audit chain legality by domain
Validate shift/capture clocks
Senior review question
Ask: what evidence proves this DFT decision is safe for production?
Key takeaways
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Common pitfalls
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Mechanism deep dive
Scan flops are stitched into chains based on clock, power, and physical constraints; poor stitching increases test time and routing pain.