DFT / ATPG · All levels
Chain Stitching Rules: Worked Example
Worked Example for Chain Stitching Rules.
Worked example
Worked Example for Chain Stitching Rules focuses on chain balance spread, max chain length, scan shift time. The goal is to convert metric movement into mechanism, owner, and release decision.
A release review shows regression on chain balance spread, max chain length, scan shift time. The strongest first move is to freeze evidence, isolate one failing bucket, and prove mechanism before changing flow knobs.
Sequence under inspection
DFT FLOW - Chain Stitching Rules
scan insertion -> chain stitch -> compression map -> ATPG -> tester apply -> diagnosis
| | | | |
controllability shift balance channel use coverage silicon correlation
Primary metric: chain balance spread, max chain length, scan shift timeChain stitching constraints
SCAN CHAINS
clock_domain_A: FF1 -> FF2 -> FF3 -> SO
clock_domain_B: FF4 -> FF5 -> FF6 -> SO
Rules:
1) keep domains legal
2) balance chain length
3) avoid long physical detoursCapture failing report and exact run tags.
Tag scenario (mode, lot/corner, pattern class).
Trace first dependency that changed.
Compare against chain map, balance histogram, stitch rule deck.
Choose one reversible fix and predefine regression checks.
Did the fix work?
BEFORE / AFTER - Chain Stitching Rules
metric quality
^
| --- release target
| o regressed
| o baseline
| o after fix
+-------------------------------> closure iteration
Prove quality, timing, and test-power all moved safely.DFT deep dive
Scan architecture quality determines whether ATPG can control and observe real silicon state.
Concept diagram
SCAN INSERTION FLOW
scan-ready RTL -> scan replacement -> stitch chains -> DRC -> ATPG handoffMetric graph
CHAIN BALANCE
chain length spread
low spread = better shift time
high spread = routing + hold riskReports and artifacts
scan insertion summary
chain balance report
scan DRC log
clocking legality report
Mini case study
Coverage plateau traced to non-scan flops in reset islands; RTL + DFT lint policy fixed root cause.
Debug branches
Check scan replacement first
Audit chain legality by domain
Validate shift/capture clocks
Senior review question
Ask: what evidence proves this DFT decision is safe for production?
Key takeaways
State metric, lot/corner context, and pattern tag with every claim.
Treat timing, power, and quality as one signoff problem.
Common pitfalls
Chasing coverage without legality checks.
Ignoring test-power side effects of pattern changes.
Debugging silicon without reproducible tags.
Principal DFT review addendum
Scan flops are stitched into chains based on clock, power, and physical constraints; poor stitching increases test time and routing pain.
Metric: chain balance spread, max chain length, scan shift time