Reports and metrics

Reports & Metrics for Memory Repair Flow focuses on repairable fail ratio, spare utilization, post-repair yield uplift. The goal is to convert metric movement into mechanism, owner, and release decision.

A report should support a release decision for repairable fail ratio, spare utilization, post-repair yield uplift. One headline number is rarely enough without setup tags and bucket-level evidence.

Metric movement

METRIC GRAPH - repairable fail ratio, spare utilization, post-repair yield uplift

quality metric
  ^
  |                         target
  |                       - - - - - - -
  |                  o after fix + regression
  |              o
  |         o baseline
  |    o regressed run
  +--------------------------------------> closure iteration
    input audit     focused fix      signoff review

Readout:
  - explain what moved, why it moved, and who approved it

Distribution view

PATTERN HISTOGRAM - Memory Repair Flow

pattern count
  |      ***
  |    *******
  |  ***********
  |*************  <- high-volume tail (optimize here)
  +--------------------> pattern buckets
   smoke  stuck-at  transition  diagnosis

Balance quality and tester limits together.

• Track repairable fail ratio, spare utilization, post-repair yield uplift by context and pattern class.

• Review trend and bucket detail together.

• Keep quality, timing, and power metrics in one dashboard.

• Store each metric next to the artifact and run tag.

DFT deep dive

BIST value is realized only when insertion, diagnosis, and repair are tied to production flow.

Concept diagram

BIST FLOW

insert MBIST/LBIST -> execute -> collect signatures -> diagnose/repair -> signoff

Metric graph

REPAIR EFFECT

yield
  ^
  |      o pre-repair
  |             o post-repair
  +---------------------> lot

Reports and artifacts

• MBIST insertion coverage

• repair signature report

• LBIST resistant fault list

• BIST release checklist

Mini case study

Fuse programming mismatch blocked repair activation; corrected bring-up script recovered expected yield uplift.

Debug branches

• Validate BIST reachability

• Correlate fail maps to repair signatures

• Audit in-field boot test budget

Senior review question

Ask: what evidence proves this DFT decision is safe for production?

Key takeaways

• State metric, lot/corner context, and pattern tag with every claim.

• Treat timing, power, and quality as one signoff problem.

Common pitfalls

• Chasing coverage without legality checks.

• Ignoring test-power side effects of pattern changes.

• Debugging silicon without reproducible tags.

Reading reports