Step-by-step analysis walkthrough

Use when you own Test-Mode SDC in a DFT closure review.

1. Open release criteria and failing metric dashboard.

2. Partition failures by pattern family and operating context.

3. Inspect constraints, clocks, masks, and unknown handling.

4. Check architecture assumptions against implementation reality.

5. Review diagnosis evidence for repeatability.

6. Assign owner and propose smallest high-confidence change.

7. Run timing, power, and quality regressions.

8. Capture final signoff or waiver decision.

Artifacts to collect

• test-mode SDC, constraint audit report, test path summary

• pattern tag manifest

• tester program revision

• signoff checklist

• owner tracker

Decision memo template

DFT DECISION MEMO - Test-Mode SDC
scenario:
metric:
hypothesis:
fix:
regression:
owners: STA owner, DFT owner, ATPG owner

Reference visuals

Test SDC contract

test clocks + test enables + mode exceptions
    -> shift/capture timing checks
    -> legal test closure

DFT deep dive

Test signoff fails when shift/capture timing and test power are treated independently.

Concept diagram

TEST SIGNOFF LOOP

test SDC -> shift/capture timing -> power-aware ATPG -> IR validation -> release

Metric graph

TEST CURRENT

functional current  baseline
scan shift current  peak-risk zone

Reports and artifacts

• test-mode STA report

• shift/capture split

• test power IR map

• waiver tracker

Mini case study

At-speed patterns passed timing but failed in production due to peak shift IR; staggered capture and power-aware fill resolved.

Debug branches

• Tag test and functional corners separately

• Check hold in shift mode

• Correlate fail bins with power hotspots

Senior review question

Ask: what evidence proves this DFT decision is safe for production?

Key takeaways

• State metric, lot/corner context, and pattern tag with every claim.

• Treat timing, power, and quality as one signoff problem.

Common pitfalls

• Chasing coverage without legality checks.

• Ignoring test-power side effects of pattern changes.

• Debugging silicon without reproducible tags.

Principal DFT review addendum

Dedicated test SDC captures scan clocks, test enables, and exceptions needed to analyze shift and capture behavior correctly.

Metric: test SDC completeness, false test-path violations, test constraint audit score