Step-by-step analysis walkthrough

Use when you own Shift vs Capture Timing in a DFT closure review.

1. Open release criteria and failing metric dashboard.

2. Partition failures by pattern family and operating context.

3. Inspect constraints, clocks, masks, and unknown handling.

4. Check architecture assumptions against implementation reality.

5. Review diagnosis evidence for repeatability.

6. Assign owner and propose smallest high-confidence change.

7. Run timing, power, and quality regressions.

8. Capture final signoff or waiver decision.

Artifacts to collect

• shift/capture timing report, at-speed validation logs, path-group summary

• pattern tag manifest

• tester program revision

• signoff checklist

• owner tracker

Decision memo template

DFT DECISION MEMO - Shift vs Capture Timing
scenario:
metric:
hypothesis:
fix:
regression:
owners: STA owner, DFT owner, PD owner

Reference visuals

Timing split

shift mode: hold-dominant
capture mode: setup-dominant

Do not sign off one without the other.

DFT deep dive

Test signoff fails when shift/capture timing and test power are treated independently.

Concept diagram

TEST SIGNOFF LOOP

test SDC -> shift/capture timing -> power-aware ATPG -> IR validation -> release

Metric graph

TEST CURRENT

functional current  baseline
scan shift current  peak-risk zone

Reports and artifacts

• test-mode STA report

• shift/capture split

• test power IR map

• waiver tracker

Mini case study

At-speed patterns passed timing but failed in production due to peak shift IR; staggered capture and power-aware fill resolved.

Debug branches

• Tag test and functional corners separately

• Check hold in shift mode

• Correlate fail bins with power hotspots

Senior review question

Ask: what evidence proves this DFT decision is safe for production?

Key takeaways

• State metric, lot/corner context, and pattern tag with every claim.

• Treat timing, power, and quality as one signoff problem.

Common pitfalls

• Chasing coverage without legality checks.

• Ignoring test-power side effects of pattern changes.

• Debugging silicon without reproducible tags.

Principal DFT review addendum

Shift mode is hold-sensitive while capture mode is setup-sensitive; closure must preserve both under test clocking assumptions.

Metric: shift hold violations, capture setup failures, at-speed pattern pass rate