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Course contents

  • How to Use This Course
  • Reading Path
  • CDC/RDC Glossary
  • CDC/RDC Metrics Reference
  • CDC/RDC Interview Prep
  • CDC/RDC Signoff Cheatsheet
  • Clock Domains and Failure Modes8
  • Metastability and Synchronizers16
    • MTBF & Synchronizer Math
    • Two-Flop Synchronizers in Practice
    • Multi-bit CDC Hazards
      • Bus Tearing
      • Why Bitwise Sync Fails
      • Skew and Capture Window
      • Safe Patterns Overview
    • Synchronizer Selection Guide
  • CDC Protocols and Handshakes16
  • Reconvergence and Gray Coding16
  • Reset Domain Crossing16
  • Architecture and Design Rules16
  • CDC Signoff Methodology24
  • RDC Signoff16
  • Debug and Case Studies11
  • CDC and RDC Interview Prep30
  • Capstone: Sign Off a Multi-clock Peripheral4
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‹Multi-bit CDC Hazards
  1. Topics
  2. CDC & RDC
  3. Metastability and Synchronizers
  4. Multi-bit CDC Hazards
  5. Skew and Capture Window

Part 2 · Metastability and Synchronizers · All levels

Skew and Capture Window

The capture window between bits, the skew budget, and why layout skew alone is not a safe design basis.

On this page

    Tearing can be read as a timing problem: the destination clock samples each bit at a slightly different effective moment because of wire and cell delay differences, and a transition that falls inside the spread of those moments is captured inconsistently.

    The capture window

    For one bit, the vulnerable moment is its own setup/hold window. For a word, the vulnerable span is the whole spread of arrival times across bits plus the sampling window: any transition inside that span can tear. The wider the skew between bits, the larger the fraction of transitions at risk.

    Contributor

    Effect on the word

    Wire delay differences between bits

    Spread the arrivals; the dominant term on long routes.

    Cell delay differences in per-bit flops

    Add a smaller but always-present spread.

    Clock skew at the sampling flops

    Shifts each bit's effective sampling moment.

    Source transition rate

    Decides how often a transition lands inside the span.

    Why layout skew alone is not a safe basis

    Matching wire lengths can shrink the skew, but the residual depends on routing, corners, voltage, and temperature, and it must be re-proven after every layout change. Worse, matched skew only narrows the vulnerable span; the word still tears whenever a transition lands inside it. Skew control is a useful hardening step, never the safety argument. The safety argument is always a protocol that tolerates arbitrary skew.

    What the tools check

    Structural analysis does not measure your skew; it checks that a protocol exists. A matched-layout bus with per-bit synchronisers and no protocol is still reported as an unsynchronised multi-bit crossing, whatever the layout claims.

    Warning

    Never accept “the bits are matched to 50 ps so it is safe” as a waiver. Ask what happens at the worst corner after the next route change, and require the protocol that makes the answer “nothing”.

    Check yourself Halving the skew between bits halves the vulnerable span. Does it halve the bug?

    No. It halves how often a transition lands inside the span, but every transition inside it can still tear. Only a protocol removes the bug rather than thinning it.

    Check yourself Two bits of a bus travel very different distances to the destination. Which crossing structure makes that harmless?

    Any real protocol: Gray code for stepping counters, a handshake or load pulse holding the data stable, a FIFO for streams, or dual-clock RAM. All of them tolerate arbitrary skew by construction.

    Related topics

    • Bus Tearing

    • Safe Patterns Overview

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    See also

    • Bus Tearing