Term | Meaning | Taught in |
|---|---|---|
Address and register sweep | A test that reads or writes every region and register and checks the reset value, access type and response against the map. | |
Connectivity test | A test that forces each source and checks the matching destination, for example each interrupt line against its controller input. | |
Firmware co-simulation | Running the real boot code against the RTL, so reset order, register contracts and timing are exercised the way software will use them. | |
Gate-level simulation | Simulating the netlist with cell delays to find reset, X and timing problems the RTL hides. | |
JTAG and TAP | The public test access standard, with a port controller that gives access to scan chains and debug. Its pins need safe defaults. | |
Lockstep and parity | Safety mechanisms that detect a fault by comparing two copies or checking a parity bit, then report and react. | |
Performance counter | A hardware counter of cycles, beats or stalls on a link. A miss against the budget is read from counters first. | |
Planted bug | A deliberately introduced integration mistake used to prove a test can catch it. NanoSoC has ten. | |
Power-aware simulation | Simulation that switches domains off and applies isolation and retention behaviour, so power-intent mistakes show up as X. | |
Scan chain | Flops connected into shift registers in test mode so internal state can be loaded and read. The integrator joins block chains at the top. | |
Self-test in ROM | Boot-code checks, such as reading DMA reset values and moving a short stream, run before the image is trusted. | |
Test mode | A chip state where functional clocks and resets are replaced by test controls. Entering it needs a defined pin sequence. | |
Top-level test list | The list of chip-level tests, each mapped to the integration bug it can catch. | |
X propagation | Unknown values spreading through a netlist from an unreset or unpowered source. They are a sign of a missing reset or isolation. |
Back to the Glossary for the other groups and the look-alike terms.